| 12:58 | Opening remarks Toshiro Hiramoto (JSAP Executive Director , The Univ. of Tokyo)Greeting
 | 
| 12:59 | Greeting Fernando Guarin (IEEE/EDS President , GLOBALFOUNDRIES)
 | 
| 13:00 | Overall introduction of IRDS/SDRJ activities in 2017 including SA Yoshihiro Hayashi (SDRJ Chair , Renesas Electronics Corporation)
 | 
| 13:30 | Roadmapping Applications Benchmarking: Challenges and Predictions Tom Conte (IRDS-AB Chair , Georgia Inst. of Tech.)
 | 
| 14:00 | Challenges for Communication Between Systems Through 2033 Michael Garner (IRDS-OSC Chair , Garner Nanotechnology Solutions)
 | 
| 14:30 | Topical issues in wireless access networks towards 2020 and beyond Takashi Shimizu (NTT)
 
 | 
| 15:00 | 休憩 | 
| 15:15 | More Moore; The Transformation of Moore’s Law, 2D Scaling to be replaced by Functional and Power Scaling with 3D Technology Yuzo Fukuzaki (Sony Semiconductor Solutions Corporation)
 | 
| 15:45 | Technology Trends in Advanced Lithography Hidemi Ishiuchi (EIDEC)
 | 
| 16:00 | Beyond CMOS (Emerging Research Devices and Materials) for Non von Neumann Architecture Hiroyuki Akinaga (AIST)
 | 
| 16:30 | Critical issues in contamination control for advanced LSI processing Koichiro Saga (Sony Semiconductor Solutions)
 
 | 
| 16:45 | ESH/FI challenges to support manufacturing next generation devices Supika Mashiro (Tokyo Electron)
 
 | 
| 17:00 | Metrology requirements and potential solutions for next generation Devices Koichi Sejima (Sony Semiconductor Solutions Corporation)
 
 | 
| 17:15 | Panel Discussions | 
| 17:45 | Closing remarks Yoshihiro Hayashi (SDRJ Chair , Renesas Electronics Corporation)
 |