12:58 |
Opening remarks
Toshiro Hiramoto (JSAP Executive Director , The Univ. of Tokyo)Greeting |
12:59 |
Greeting
Fernando Guarin (IEEE/EDS President , GLOBALFOUNDRIES) |
13:00 |
Overall introduction of IRDS/SDRJ activities in 2017 including SA
Yoshihiro Hayashi (SDRJ Chair , Renesas Electronics Corporation) |
13:30 |
Roadmapping Applications Benchmarking: Challenges and Predictions
Tom Conte (IRDS-AB Chair , Georgia Inst. of Tech.) |
14:00 |
Challenges for Communication Between Systems Through 2033
Michael Garner (IRDS-OSC Chair , Garner Nanotechnology Solutions) |
14:30 |
Topical issues in wireless access networks towards 2020 and beyond
Takashi Shimizu (NTT)
|
15:00 |
休憩 |
15:15 |
More Moore; The Transformation of Moore’s Law, 2D Scaling to be replaced by Functional and Power Scaling with 3D Technology
Yuzo Fukuzaki (Sony Semiconductor Solutions Corporation) |
15:45 |
Technology Trends in Advanced Lithography
Hidemi Ishiuchi (EIDEC) |
16:00 |
Beyond CMOS (Emerging Research Devices and Materials) for Non von Neumann Architecture
Hiroyuki Akinaga (AIST) |
16:30 |
Critical issues in contamination control for advanced LSI processing
Koichiro Saga (Sony Semiconductor Solutions)
|
16:45 |
ESH/FI challenges to support manufacturing next generation devices
Supika Mashiro (Tokyo Electron)
|
17:00 |
Metrology requirements and potential solutions for next generation Devices
Koichi Sejima (Sony Semiconductor Solutions Corporation)
|
17:15 |
Panel Discussions |
17:45 |
Closing remarks
Yoshihiro Hayashi (SDRJ Chair , Renesas Electronics Corporation) |